FMS 2024: Introspect Wins Award
For M5512 GDDR7 memory test system
This is a Press Release edited by StorageNewsletter.com on August 9, 2024 at 12:27 pmIntrospect Technology has been awarded the “Best of Show” award, for its M5512 GDDR7 Memory Test System, at FMS: The Future of Memory and Storage.
The award is given to the most outstanding product, service, or innovation showcased at FMS. Introspect Technology received this honor for its M5512 GDDR7 Memory Test System, the world’s first commercial solution for validating and characterizing GDDR7 memories and interfaces. Winning the award under the Most Innovative Memory Technology in the DRAM Test System category, the M5512 allows users to gain deep insights into the performance characteristics and design qualities of their products. It is currently playing a central role in the introduction of GDDR7 to next-gen computer and AI processing architectures.
“Test systems play a critical role in the development of next-gen memories and ML architectures,” said Jay Kramer, chairman of the awards program and president of Network Storage Advisors Inc. “We are proud to recognize Introspect Technology for the industry’s first test system for characterizing and validating memory devices based on the new JEDEC GDDR7 spec. This system delivers insights into the performance characteristics and design qualities of memory products.”
Dr. Mohamed Hafed, CEO, Introspect, said: “We are thrilled to receive the ‘Best of Show’ award at FMS. This award is a testament to the hard work and dedication of our entire team, who are committed to pushing the boundaries of what is possible in the memory and memory interface test areas. We are excited to continue to innovate and provide our customers with top-notch testing solutions.”
The M5512 fills a gap of equipment availability for engineers of different disciplines to get access to testing, such as characterization, firmware verification, and software regression providing efficiencies for its users. On one hand, it provides bench-grade measurement accuracy and precision, but at a scale that is not possible using conventional bit error rate tester (BERT) solutions. And on the other hand, it is programmed and operated like automatic test equipment (ATE), yet it does not need special cooling and can be located on a user’s local bench instead of a specialized tester lab. It thus offers great product engineering efficiencies. This is a much-needed solution to help memory makers verify their products and achieve shorter time to market.