R&D: CRRC, Coordinating Retention Errors, Read Disturb Errors and Huffman Coding on TLC NAND

IEEE Transactions on Dependable and Secure Computing has published an article written by Ta-Ching Yu, Chin-Hsien Wu, and Yan-Qi Liao, Department of Electronic and Computer Engineering, National Taiwan University of Science and Technology, Taipei, Taiwan.

Abstract: “Nowadays, TLC NAND flash memory has become a mainstream storage medium because of its large capacity and low cost. However, TLC NAND flash memory could have the reliability problem (such as the retention errors and the read disturb errors), as the cell capacity increases. Because the reasons of the retention errors and the read disturb errors are due to 8 different states in a TLC cell, we will propose a method to coordinate the retention errors, the read disturb errors and the Huffman coding on TLC NAND flash memory by removing some unsuitable states when different data accesses are considered. According to the experimental results, the proposed method can utilize the compression of the Huffman coding to improve the performance. In addition, the proposed method can also remove the unsuitable states that are susceptible to the retention errors and the read disturb errors to enhance the reliability of TLC NAND flash memory.“