R&D: Design and Numerical Study of Flux Control Effect Dominant MAMR Head: Flux Control Writer

IEEE Transactions on Magnetics has published an article written by Naoyuki Narita, M. Takagishi, H. Iwasaki, H. Suto, Corporate Research and Development Center, Toshiba Corporation, Kawasaki, Japan, G. Koizumi, A. Takeo, Toshiba Electronic Devices and Storage Corporation, Yokohama, Japan, and T. Maeda, Corporate Research and Development Center, Toshiba Corporation, Kawasaki, Japan.

Abstract: “Flux control effect (FC effect) is one of the field modification effects in microwave-assisted magnetic recording heads by locating the spin torque oscillator in the write gap (WG). In this article, we propose a flux control writer (FC writer) that maximizes the FC effect by flipping the magnetization in the WG with respect to the gap field. In the FC writer, the field gradient gain is emphasized when compared with the amplitude gain. The bit error rate is also improved by about −0.2 compared with a conventional writer at the same erase width. These results indicate that the improvement of recording properties may be possible on any media using FC writer.“