R&D: Mitigating Negative Impacts of Read Disturb in SSDs

ACM Transactions on Design Automation of Electronic Systems has published an article written by Jun Li, Bowen Huang, Zhibing Sha, Zhigang Cai, Jianwei Liao, Southwest University of China, Chongqing, China, Balazs Gerofi, and Yutaka Ishikawa, Riken Center for Computational Science, Riken, Wako, Japan.

Abstract: “Read disturb is a circuit-level noise in solid-state drives (SSDs), which may corrupt existing data in SSD blocks and then cause high read error rate and longer read latency. The approach of read refresh is commonly used to avoid read disturb errors by periodically migrating the hot read data to other free blocks, but it places considerable negative impacts on I/O (Input/Output) responsiveness. This article proposes scheduling approaches on write data and read refresh operations, to mitigate the negative effects caused by read disturb. To be specific, we first construct a model to classify SSD blocks into two categories according to the estimated read error rate by referring to the factors of block’s P/E (Program/Erase) cycle and the accumulated read count to the block. Then, the data being intensively read will be redirected to the block having a small read error rate, as it is not sensitive to read disturb even though the data will be heavily requested. Moreover, we take advantage of reinforcement learning to predict the idle interval between two I/O requests for purposely conducting (partial) read refresh operations. As a result, it is able to minimize negative impacts toward subsequent incoming I/O requests and to ensure I/O responsiveness. Through a series of emulation tests on several realistic disk traces, we demonstrate that the proposed mechanisms can noticeably yield performance improvements on the metrics of read error rate and I/O latency.“