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R&D: Enhanced Ferroelectric Polarization in Epitaxial Superconducting–Ferroelectric Heterostructure Thin Films for NVM Cell

For non-volatile ferroelectric random access memory elements

AIP Advances has published an article written by Ravikant, CSIR-National Physical Laboratory, Dr. K. S. Krishnan Marg, New Delhi 110012, India, Academy of Scientific and Innovative Research (AcSIR), CSIR-National Physical Laboratory Campus, Dr. K. S. Krishnan Road, New Delhi 110012, India, and Department of Physics, Government College Sailana, Vikram University, Ujjain 457550, India, Charanjeet Singh,CSIR-National Physical Laboratory, Dr. K. S. Krishnan Marg, New Delhi 110012, India, and Academy of Scientific and Innovative Research (AcSIR), CSIR-National Physical Laboratory Campus, Dr. K. S. Krishnan Road, New Delhi 110012, India, Anjali Panchwanee,UGC-DAE, Consortium for Scientific Research, Khandwa Road, Indore 452001, India, Rajib K. Rakshit, Manju Singh,CSIR-National Physical Laboratory, Dr. K. S. Krishnan Marg, New Delhi 110012, India, and Academy of Scientific and Innovative Research (AcSIR), CSIR-National Physical Laboratory Campus, Dr. K. S. Krishnan Road, New Delhi 110012, India, V. R. Reddy, Ram Janay Choudhary,UGC-DAE, Consortium for Scientific Research, Khandwa Road, Indore 452001, India, V. N. Ojha, and Ashok Kumar, CSIR-National Physical Laboratory, Dr. K. S. Krishnan Marg, New Delhi 110012, India, and Academy of Scientific and Innovative Research (AcSIR), CSIR-National Physical Laboratory Campus, Dr. K. S. Krishnan Road, New Delhi 110012, India.

Abstract: We report the growth and polarization switching properties of epitaxial ferroelectric–superconducting heterostructure PbZr0.52Ti0.48O3 (PZT) (100 nm)/YBa2Cu3O7−δ (YBCO) (100 nm) thin films for non-volatile ferroelectric random access memory elements. The epitaxial nature of the heterostructure is verified using the reciprocal space mapping data with the superconducting phase transition temperature (Tc) of nearly 25 K far below the Tc of as-grown YBCO under the same condition. The significant remanent polarization (Pr) 45µC/cm2 at 1 kHz can switch from one state to another using 1μs pulse. The devices meet the basic criteria of memory elements, such as high resistance 10 GΩ at 8 V, a butterfly-like capacitance–voltage (C/V) loop, significant polarization, a sharp change in the displacement current, long-time charge retention, and small fatigue at room temperature.

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