Elwha Assigned Patent
Self-testing storage devices
By Francis Pelletier | July 5, 2018 at 2:01 pmElwha LLC, Bellevue, WA, has been assigned a patent (10,008,286) developed by Ozawa, Bowers, Jeffrey A., Bellevue, WA, Hagelstein, Peter L., Carlisle, MA, Hyde, Roderick A., Redmond, WA, Ishikawa, Muriel Y., Livermore, CA, Kare, Jordin T., Seattle, WA, Wood, Jr., Lowell L., Bellevue, WA, and Wood, Victoria Y. H., Livermore, CA, for a “self-testing data storage devices and methods.“
The abstract of the patent published by the U.S. Patent and Trademark Office states: “Systems and methods for self-testing archival memory devices are described. The memory device includes a data storage component capable of being coded with data. The memory device further includes a read-write mechanism configured to read, write, and delete data stored on the data storage component. The memory device includes a read-write controller configured to control the read-write mechanism based on input received through a device interface of the memory device, wherein the device interface of the memory device is configured to connect to an external computing device. The memory device further includes a diagnostic controller configured to perform a test on at least one of the data stored on the data storage component, the data storage component, and the read-write mechanism. The memory device includes a power source configured to provide operational power to the diagnostic controller when the memory device is not connected to an external power source.”
The patent application was filed on November 7, 2014 (14/536,472).