SII Semiconductor Assigned Patent

SII Semiconductor Corporation, Chiba, Japan, has been assigned a patent (9,875,154) developed by Miyagi, Masanori, and Yamasaki, Taro, Chiba, Japan, for a “non-volatile semiconductor storage device and method of testing the same.“

The abstract of the patent published by the U.S. Patent and Trademark Office states: “Provided is a non-volatile semiconductor storage device which can be downsized with a simple circuit without impairing the function of an error correcting section, and a method of testing the non-volatile semiconductor storage device. An error correction circuit is configured to perform error detection and correction of merely the same number of bits as data bits, and a circuit for performing error detection and correction of check bits is omitted to downsize the circuit. A multiplexer for, in a testing state, replacing a part of the data bits read out from a storage element array with the check bits, and inputting the check bits to the error correction circuit is provided. Thus, error detection and correction of the check bits are performed to enable shipment inspection concerning the check bits as well.”

The patent application was filed on July 1, 2015 (14/789,168).