Unitest Assigned Patent

Unitest, Inc., Yongin-si, Gyeonggi-do, Korea, has been assigned a patent (9,153,345) developed by Lee, Eui Won, Seongnam-si, Korea, and Oh, Hyo Jin, Yongin-si, Korea, for a “error generating apparatus for solid state drive tester.”

The abstract of the patent published by the U.S. Patent and Trademark Office states: ”Disclosed is an error generating apparatus of a solid state drive tester. The error processing operation of the storage is tested by inserting errors into a specific instruction to be transmitted to the storage, and detecting the results of the error processing operation of the storage when testing the storage. The error generating apparatus includes a host terminal for receiving a test condition for a test of a storage from a user, and a test control unit for generating a test pattern according to the test condition or generating a test pattern randomly, generating error data used to test an error characteristic of the storage, and testing the storage based on the test pattern and a normal instruction or an error instruction which is formed by inserting the error data into the normal instruction.“

The patent application was filed on June 19, 2013 (13/921,949).