MicroSense Sells Next-Gen VSM Magnetic Metrology Systems

MicroSense, LLC, in high sensitivity vibrating sample magnetometers (VSMs), magnetic metrology systems, high resolution capacitive sensors, and wafer metrology systems, has booked and shipped multiple customer orders for its next generation EZ series VSM magnetic metrology systems from global customers.

These systems are used to characterize the magnetic properties of magnetic thin films or any liquid or solid.

"We are pleased to announce receiving multiple orders and shipping our next generation EZ series VSM," said Tom McNabb , president and COO of MicroSense. "With 30 years of VSM experience, we continually strive to improve our metrology system performance in providing value to our global customers. MicroSense is the only company to offer both VSM systems for R&D, and also magnetic metrology systems for production environments."

"The EZ series VSM systems offer exceptional field control resulting in faster measurements with improved sensitivity. The signal to noise ratio for a typical magnetic measurement at temperature is at least 5 times better than what is offered by our competitors," according to Erik Samwel , Ph.D., director of VSM business at MicroSense. "Compared to our previous generation VSM’s, these new systems offer improved performance, a smaller footprint, and a more contemporary design."

With the June 12, 2012 acquisition of SigmaTech, Inc., MicroSense now offers automated wafer metrology solutions for LED, MEMS and semiconductor manufacturing.