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R&D: GeSeTe-based OTS Selector Integrated with ReRAM for High-density 1S-1R Memory Arrays

Developed high-performance binary Ovonic Threshold Switching (OTS) selector based on GeSeTe and resistive random access memory (ReRAM) device based on TaOx.

AIP Advances has published an article written by Hyun Kyu Seo, June Hyuk Lee, and Min Kyu Yang, Department of Artificial Intelligence Convergence, Sahmyook University, 815 Hwarang-ro, Nowon-gu, Seoul 01795, Republic of Korea.

Abstract: In this study, we developed a high-performance binary Ovonic Threshold Switching (OTS) selector based on GeSeTe and a resistive random access memory (ReRAM) device based on TaOx. These were integrated into a 1 Selector-1 ReRAM (1S-1R) architecture to address challenges in high-density memory and advanced computing. The GeSeTe-based OTS selector exhibited a high switching ratio (Ion/Ioff > 105), ultra-low off-current (∼1 nA), and fast switching speed (<10 ns), while the TaOx-based ReRAM achieved a high on/off ratio (>20), rapid switching (100 ns), excellent endurance (>109 cycles), and stable retention at 125 °C. The integrated 1S-1R structure effectively suppressed leakage currents using a 1/2 bias scheme and was scaled to a 1 kb X-point memory array. The array demonstrated stable conductance distribution and efficient multiply-and-accumulate operations, with consistency between experimental and theoretical results validating its scalability and reliability. This work highlights the potential of the 1S-1R architecture for next-generation memory and neuromorphic systems, providing a scalable, energy-efficient solution for data-intensive applications by leveraging the complementary strengths of GeSeTe-based OTS selectors and TaOx-based ReRAM devices.

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