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With SBExpress-DT5CD NVMe Test System, SANBlaze Enters Client Drive Market

Supports NVMe PCIe Gen5 validation and compliance testing for client drives.

SANBlaze Technology Inc. announced the 1st platform to support NVMe PCIe Gen5 validation and compliance testing for client drives.

SBExpress-DT5CD client drive NVMe test system

Sanblaze Sbexpress Dt5cd Client Drive Nvme Test System 1
The SBExpress-DT5CD client drive test system brings enterprise level test capabilities to the client market at an affordable price.
It offers enterprise test capabilities for client drive development, QA, and validation teams, and includes the company’s Certified by SANBlaze (SBCert) compliance test suite, recognized as an industry benchmark.

The system is self-contained, quiet, and portable, for a work-from-home environment or traveling to customer sites.

We are excited to announce our new SBExpress-DT5CD Client Drive NVMe Test System, an affordable offering that brings world-class Enterprise-level NVMe testing to the client drive market,” said Rick Walsh, SVP. “With this new offering we are providing NVMe testing expertise to Client Drive manufacturers, delivering to market a more robust and reliable storage device.

All Enterprise level attributes are available through the same SANBlaze automated Infrastructure for the SBExpress-DT5CD. This includes the industry renowned Certified by SANBlaze test suite, which allows for superior test capability with a simple click of the user’s mouse.

Riser technology
The SBExpress-DT5CD client drive test system also includes the company’s proprietary Riser technology with its patented iRiser5 device included for precision power control and measurement and high speed signal glitching.

iRiser5 device for precision power control, measurement and high speed signal glitching

Sanblaze Iriser5 Device For Precision Power Control, Measurement And High Speed Signal Glitching

iRiser5 features
Features of the iRiser5 include:

  • Precision control of PCIe/NVMe power and control signals while continuously monitoring the power of each device under test (DUT)
  • A sequence of events can be scheduled on each signal line with up to 10ns glitch precision, with each event action loading at 80ns interval to hours
  • Simple or complex sequences can be defined and loaded to the iRiser from the host system
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