To accelerate growth in data storage and protection market
Hyperconverged infrastructure veteran will drive company's edge computing strategy
Featuring 2x2.5GbE and 2x10GBASE-T ports, 3xPCIe Gen 4 expansion slots, 2xUSB 3.2 Gen 2 ports, and 1x4K HDMI output
First product ME mini is equipped with 6xM.2 SSD slots, offering total capacity of up to 24TB, X86 processor architecture with dual 2.5Gb Ethernet ports, and Windows OS includes built-in NAS storage service
Including New-Gen OceanStor Dorado converged all-flash storage for mission-critical applications, OceanStor A800 New-Gen AI Storage for large AI model training, OceanStor Pacific 9928 all-flash scale-out storage for data analysis, OceanProtect E8000 all-flash backup storage for data backup, Geo-Redundant 4DC five-copy solution, and RDM (research data management) storage solution
Global presence and R&D expertise underscore 6 Data Storage Innovation Centers built in Germany, France, Türkiye, the UAE, Malaysia, and China
Titled "Elevating All-Flash Datacenters to Accelerate Intelligence-Digitalization"
Servers with Xeon Gold 6438Y+ processors, 512GB RAM, and 15TB of SSD and NMVe storage in over 68 U.S. and international edge data centers
Announced at ActiveProtect Launch Event in NYC
To protect critical data for continuous patient care says the company at HIMSS25 global health conference
For major on-premise infrastructure upgrade
Authors introduce previously unexplored nanoscale magnetic object: an analog magnetic vortex controlled by electric-field-induced ion motion, termed magneto-ionic vortex or “vortion”
Review provides in-depth analysis of recent developments in GeTe PCM, focusing on challenges and breakthroughs that have characterized its evolution.
Aluminum alloy substrate for magnetic disc and magnetic disc
Erasing flash memory, semiconductor storage device and writing, semiconductor device and erasing, semiconductor memory device and write method, memory device and method for manufacturing, memory array having error checking and correction circuit, semiconductor memory apparatus and testing